Feature Extraction based on High Order Statistics measures and Entropy for EEG biometrics - researchr publication

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Sukun Li, Sung-Hyuk Cha. Feature Extraction based on High Order Statistics measures and Entropy for EEG biometrics. In 7th International Workshop on Biometrics and Forensics, IWBF 2019, Cancun, Mexico, May 2-3, 2019. pages 1-6, IEEE, 2019. [doi]

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