Chia-Chuan Li, Soon-Jyh Chang. Modified BER Test for SAR ADCs. In IEEE International Test Conference in Asia, ITC-Asia 2020, Taipei, Taiwan, September 23-25, 2020. pages 100-105, IEEE, 2020. [doi]
@inproceedings{LiC20-39,
title = {Modified BER Test for SAR ADCs},
author = {Chia-Chuan Li and Soon-Jyh Chang},
year = {2020},
doi = {10.1109/ITC-Asia51099.2020.00029},
url = {https://doi.org/10.1109/ITC-Asia51099.2020.00029},
researchr = {https://researchr.org/publication/LiC20-39},
cites = {0},
citedby = {0},
pages = {100-105},
booktitle = {IEEE International Test Conference in Asia, ITC-Asia 2020, Taipei, Taiwan, September 23-25, 2020},
publisher = {IEEE},
isbn = {978-1-7281-8944-4},
}