Abstract is missing.
- Site-aware Anomaly Detection with Machine Learning for Circuit Probing to Prevent OverkillMincent Lee, Cheng-Tse Lu, Chia-Heng Tsai, Hao Chen, Min-Jer Wang. 1-6 [doi]
- Automatic IR-Drop ECO Using Machine LearningHeng-Yi Lin, Yen-Chun Fang, Shi-Tang Liu, Jia-Xian Chen, Chien-Mo James Li, Eric Jia-Wei Fang. 7-12 [doi]
- A Deep Learning-Based Screening Method for Improving the Quality and Reliability of Integrated Passive DevicesChien-Hui Chuang, Kuan-Wei Hou, Cheng-Wen Wu, Mincent Lee, Chia-Heng Tsai, Hao Chen, Min-Jer Wang. 13-18 [doi]
- Test Challenges of Providing Low Phase Noise Reference Clock Signal with ATE PlatformKevin Fan. 19-24 [doi]
- Development and Validation of a Novel Reliable Method for Wet Testing on Biochemical ChipPo-Ting Lai, Yu-Hao Chiu, Chieh-Wen Lu, Kuang-Hsiang Liu, Tung-Liang Chiu, Wendy Chen. 25-30 [doi]
- Novel Circuit Probing for Tiny InductorChia-Heng Tsai, Chi-Chang Lai, Hao Chen, Min-Jer Wang. 31-34 [doi]
- Design of a Highly Reliable SRAM Cell with Advanced Self-Recoverability from Soft ErrorsZhengda Dou, Albin Yan, Jun Zhou 0016, Yuanjie Hu, Yan Chen, Tianming Ni, Jie Cui 0004, Patrick Girard 0001, Xiaoqing Wen. 35-40 [doi]
- Refresh Power Reduction of DRAMs in DNN Systems Using Hybrid Voting and ECC MethodTsung-Fu Hsieh, Jin-Fu Li, Jenn-Shiang Lai, Chih-Yen Lo, Ding-Ming Kwai, Yung-Fa Chou. 41-46 [doi]
- ECC Caching Techniques for Protecting NAND Flash MemoriesShyue-Kung Lu, Zeng-Long Tsai, Chun-Lung Hsu, Chi-Tien Sun. 47-52 [doi]
- Diagnosis technique for Clustered Multiple Transition Delay FaultsYan-Shen You, Chih-Yan Liu, Mu-Ting Wu, Po-Wei Chen, James Chien-Mo Li. 53-58 [doi]
- Adaptive Test Pattern Reordering for Diagnosis using k-Nearest NeighborsChenlei Fang, Qicheng Huang, R. D. Shawn Blanton. 59-64 [doi]
- Diagnosis Outcome Prediction on Limited Data via Transferred Random ForestQicheng Huang, Chenlei Fang, R. D. Shawn Blanton. 65-70 [doi]
- On Optical Attacks Making Logic Obfuscation FragileLeonidas Lavdas, M. Tanjidur Rahman, Mark Mohammad Tehranipoor, Navid Asadizanjani. 71-76 [doi]
- A Novel Tampering Attack on AES Cores with Hardware TrojansAyush Jain, Ujjwal Guin. 77-82 [doi]
- High Efficiency and Low Overkill Testing for Probabilistic CircuitsMing-Ting Lee, Chen-Hung Wu, Shi-Tang Liu, Cheng-Yun Hsieh, James Chien-Mo Li. 83-87 [doi]
- The Decision Mechanism Uses the Multiple-Tests Scheme to Improve Test Yield in IC TestingChung-Huang Yeh, Jwu E. Chen. 88-93 [doi]
- W-ERA: One-Time Memory Repair with Wafer-Level Early Repair Analysis for Cost ReductionHayoung Lee, Donghyun Han, Hogyeong Kim, Sungho Kang. 94-99 [doi]
- Modified BER Test for SAR ADCsChia-Chuan Li, Soon-Jyh Chang. 100-105 [doi]
- Test Methodology for Defect-based Bridge FaultsYu-Pang Hu, Shuo-Wen Chang, Kai-Chiang Wu, Chi-Chun Wang, Fu-Sheng Huang, Yi-Lun Tang, Yung-Chen Chen, Ming-Chien Chen, Mango C.-T. Chao. 106-111 [doi]
- Path Delay Measurement with Correction for Temperature And Voltage VariationsYousuke Miyake, Takaaki Kato, Seiji Kajihara. 112-117 [doi]
- GPU-based Hybrid Parallel Logic Simulation for Scan PatternsLiyang Lai, Qiting Zhang, Kun-Han Hans Tsai, Wu-Tung Cheng. 118-123 [doi]
- DSSP-ATPG: A Deterministic Search-Space Parallel Test Pattern GeneratorKuen-Wei Yeh, Jiun-Lang Huang. 124-129 [doi]
- Estimation of Test Data Volume for Scan Architectures with Different Numbers of Input ChannelsFong-Jyun Tsai, Chong-Siao Ye, Yu Huang 0005, Kuen-Jong Lee, Wu-Tung Cheng, Sudhakar M. Reddy, Mark Kassab, Janusz Rajski, Shi-Xuan Zheng. 130-135 [doi]
- On Enhancing Error-Tolerability of Videos via Re-Encoding with Adaptive I-Frame InsertionTong-Yu Hsieh, Chen-Chia Chung, Jun-Tsung Wu. 136-141 [doi]
- A Self-Detection and Self-Repair Methodology for Reliable Speech Recognition Considering AWGN NoisesTong-Yu Hsieh, Yu-Min Chung. 142-147 [doi]
- Watermarking for Paper-Based Digital Microfluidic BiochipsJian-De Li, Sying-Jyan Wang, Katherine Shu-Min Li, Tsung-Yi Ho. 148-153 [doi]