Yu-Pang Hu, Shuo-Wen Chang, Kai-Chiang Wu, Chi-Chun Wang, Fu-Sheng Huang, Yi-Lun Tang, Yung-Chen Chen, Ming-Chien Chen, Mango C.-T. Chao. Test Methodology for Defect-based Bridge Faults. In IEEE International Test Conference in Asia, ITC-Asia 2020, Taipei, Taiwan, September 23-25, 2020. pages 106-111, IEEE, 2020. [doi]
Abstract is missing.