Yu-Pang Hu, Shuo-Wen Chang, Kai-Chiang Wu, Chi-Chun Wang, Fu-Sheng Huang, Yi-Lun Tang, Yung-Chen Chen, Ming-Chien Chen, Mango C.-T. Chao. Test Methodology for Defect-based Bridge Faults. In IEEE International Test Conference in Asia, ITC-Asia 2020, Taipei, Taiwan, September 23-25, 2020. pages 106-111, IEEE, 2020. [doi]
@inproceedings{HuCWWHTCCC20,
title = {Test Methodology for Defect-based Bridge Faults},
author = {Yu-Pang Hu and Shuo-Wen Chang and Kai-Chiang Wu and Chi-Chun Wang and Fu-Sheng Huang and Yi-Lun Tang and Yung-Chen Chen and Ming-Chien Chen and Mango C.-T. Chao},
year = {2020},
doi = {10.1109/ITC-Asia51099.2020.00030},
url = {https://doi.org/10.1109/ITC-Asia51099.2020.00030},
researchr = {https://researchr.org/publication/HuCWWHTCCC20},
cites = {0},
citedby = {0},
pages = {106-111},
booktitle = {IEEE International Test Conference in Asia, ITC-Asia 2020, Taipei, Taiwan, September 23-25, 2020},
publisher = {IEEE},
isbn = {978-1-7281-8944-4},
}