Test Methodology for Defect-based Bridge Faults

Yu-Pang Hu, Shuo-Wen Chang, Kai-Chiang Wu, Chi-Chun Wang, Fu-Sheng Huang, Yi-Lun Tang, Yung-Chen Chen, Ming-Chien Chen, Mango C.-T. Chao. Test Methodology for Defect-based Bridge Faults. In IEEE International Test Conference in Asia, ITC-Asia 2020, Taipei, Taiwan, September 23-25, 2020. pages 106-111, IEEE, 2020. [doi]

Authors

Yu-Pang Hu

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Shuo-Wen Chang

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Kai-Chiang Wu

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Chi-Chun Wang

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Fu-Sheng Huang

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Yi-Lun Tang

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Yung-Chen Chen

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Ming-Chien Chen

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Mango C.-T. Chao

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