A Deep Learning-Based Screening Method for Improving the Quality and Reliability of Integrated Passive Devices

Chien-Hui Chuang, Kuan-Wei Hou, Cheng-Wen Wu, Mincent Lee, Chia-Heng Tsai, Hao Chen, Min-Jer Wang. A Deep Learning-Based Screening Method for Improving the Quality and Reliability of Integrated Passive Devices. In IEEE International Test Conference in Asia, ITC-Asia 2020, Taipei, Taiwan, September 23-25, 2020. pages 13-18, IEEE, 2020. [doi]

Abstract

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