Mincent Lee, Cheng-Tse Lu, Chia-Heng Tsai, Hao Chen, Min-Jer Wang. Site-aware Anomaly Detection with Machine Learning for Circuit Probing to Prevent Overkill. In IEEE International Test Conference in Asia, ITC-Asia 2020, Taipei, Taiwan, September 23-25, 2020. pages 1-6, IEEE, 2020. [doi]
Abstract is missing.