Mincent Lee, Cheng-Tse Lu, Chia-Heng Tsai, Hao Chen, Min-Jer Wang. Site-aware Anomaly Detection with Machine Learning for Circuit Probing to Prevent Overkill. In IEEE International Test Conference in Asia, ITC-Asia 2020, Taipei, Taiwan, September 23-25, 2020. pages 1-6, IEEE, 2020. [doi]
@inproceedings{LeeLTCW20,
title = {Site-aware Anomaly Detection with Machine Learning for Circuit Probing to Prevent Overkill},
author = {Mincent Lee and Cheng-Tse Lu and Chia-Heng Tsai and Hao Chen and Min-Jer Wang},
year = {2020},
doi = {10.1109/ITC-Asia51099.2020.00012},
url = {https://doi.org/10.1109/ITC-Asia51099.2020.00012},
researchr = {https://researchr.org/publication/LeeLTCW20},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {IEEE International Test Conference in Asia, ITC-Asia 2020, Taipei, Taiwan, September 23-25, 2020},
publisher = {IEEE},
isbn = {978-1-7281-8944-4},
}