Fong-Jyun Tsai, Chong-Siao Ye, Yu Huang 0005, Kuen-Jong Lee, Wu-Tung Cheng, Sudhakar M. Reddy, Mark Kassab, Janusz Rajski, Shi-Xuan Zheng. Estimation of Test Data Volume for Scan Architectures with Different Numbers of Input Channels. In IEEE International Test Conference in Asia, ITC-Asia 2020, Taipei, Taiwan, September 23-25, 2020. pages 130-135, IEEE, 2020. [doi]
Abstract is missing.