Xiaowei Li, Paul Y. S. Cheung. Exploiting BIST Approach for Two-Pattern Testing. In 7th Asian Test Symposium (ATS 98), 2-4 December 1998, Singapore. pages 424-429, IEEE Computer Society, 1998. [doi]
@inproceedings{LiC98:5,
title = {Exploiting BIST Approach for Two-Pattern Testing},
author = {Xiaowei Li and Paul Y. S. Cheung},
year = {1998},
url = {http://csdl.computer.org/comp/proceedings/ats/1998/8277/00/82770424abs.htm},
tags = {testing, systematic-approach},
researchr = {https://researchr.org/publication/LiC98%3A5},
cites = {0},
citedby = {0},
pages = {424-429},
booktitle = {7th Asian Test Symposium (ATS 98), 2-4 December 1998, Singapore},
publisher = {IEEE Computer Society},
isbn = {0-8186-8277-9},
}