Research on Degradation Mechanism of Darlington Transistor Under Electrical and Thermal Stress

Changjun Li, Jinjun Cheng, Xiaoxu Chu, Haizhen Zhu, Fawen Xu. Research on Degradation Mechanism of Darlington Transistor Under Electrical and Thermal Stress. IEEE Access, 14:58725-58736, 2026. [doi]

Abstract

Abstract is missing.