Serial number inspection for ceramic membranes via an end-to-end photometric-induced convolutional neural network framework

Feiyang Li, Nian Cai, Xueliang Deng, Jiahao Li, Jianfa Lin, Han Wang 0001. Serial number inspection for ceramic membranes via an end-to-end photometric-induced convolutional neural network framework. J. Intelligent Manufacturing, 33(5):1373-1392, 2022. [doi]

Authors

Feiyang Li

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Nian Cai

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Xueliang Deng

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Jiahao Li

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Jianfa Lin

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Han Wang 0001

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