Serial number inspection for ceramic membranes via an end-to-end photometric-induced convolutional neural network framework

Feiyang Li, Nian Cai, Xueliang Deng, Jiahao Li, Jianfa Lin, Han Wang 0001. Serial number inspection for ceramic membranes via an end-to-end photometric-induced convolutional neural network framework. J. Intelligent Manufacturing, 33(5):1373-1392, 2022. [doi]

@article{LiCDLLW22,
  title = {Serial number inspection for ceramic membranes via an end-to-end photometric-induced convolutional neural network framework},
  author = {Feiyang Li and Nian Cai and Xueliang Deng and Jiahao Li and Jianfa Lin and Han Wang 0001},
  year = {2022},
  doi = {10.1007/s10845-020-01730-7},
  url = {https://doi.org/10.1007/s10845-020-01730-7},
  researchr = {https://researchr.org/publication/LiCDLLW22},
  cites = {0},
  citedby = {0},
  journal = {J. Intelligent Manufacturing},
  volume = {33},
  number = {5},
  pages = {1373-1392},
}