Rethinking Out-of-distribution (OOD) Detection: Masked Image Modeling is All You Need

Jingyao Li, Pengguang Chen, Zexin He, Shaozuo Yu, Shu Liu 0005, Jiaya Jia. Rethinking Out-of-distribution (OOD) Detection: Masked Image Modeling is All You Need. In IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2023, Vancouver, BC, Canada, June 17-24, 2023. pages 11578-11589, IEEE, 2023. [doi]

@inproceedings{LiCHY0J23,
  title = {Rethinking Out-of-distribution (OOD) Detection: Masked Image Modeling is All You Need},
  author = {Jingyao Li and Pengguang Chen and Zexin He and Shaozuo Yu and Shu Liu 0005 and Jiaya Jia},
  year = {2023},
  doi = {10.1109/CVPR52729.2023.01114},
  url = {https://doi.org/10.1109/CVPR52729.2023.01114},
  researchr = {https://researchr.org/publication/LiCHY0J23},
  cites = {0},
  citedby = {0},
  pages = {11578-11589},
  booktitle = {IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2023, Vancouver, BC, Canada, June 17-24, 2023},
  publisher = {IEEE},
  isbn = {979-8-3503-0129-8},
}