Jingyao Li, Pengguang Chen, Zexin He, Shaozuo Yu, Shu Liu 0005, Jiaya Jia. Rethinking Out-of-distribution (OOD) Detection: Masked Image Modeling is All You Need. In IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2023, Vancouver, BC, Canada, June 17-24, 2023. pages 11578-11589, IEEE, 2023. [doi]
Abstract is missing.