Activity-Driven Fine-Grained Clock Gating and Run Time Power Gating Integration

Li Li, Ken Choi, Haiqing Nan. Activity-Driven Fine-Grained Clock Gating and Run Time Power Gating Integration. IEEE Trans. VLSI Syst., 21(8):1540-1544, 2013. [doi]

@article{LiCN13,
  title = {Activity-Driven Fine-Grained Clock Gating and Run Time Power Gating Integration},
  author = {Li Li and Ken Choi and Haiqing Nan},
  year = {2013},
  doi = {10.1109/TVLSI.2012.2212732},
  url = {http://dx.doi.org/10.1109/TVLSI.2012.2212732},
  researchr = {https://researchr.org/publication/LiCN13},
  cites = {0},
  citedby = {0},
  journal = {IEEE Trans. VLSI Syst.},
  volume = {21},
  number = {8},
  pages = {1540-1544},
}