Combining multi-scale dissimilarities for image classification

Yan Li, Robert P. W. Duin, Marco Loog. Combining multi-scale dissimilarities for image classification. In Proceedings of the 21st International Conference on Pattern Recognition, ICPR 2012, Tsukuba, Japan, November 11-15, 2012. pages 1639-1642, IEEE, 2012. [doi]

Abstract

Abstract is missing.