A new multiscale texture surface defect detection method based on convolutional neural network

Kaixiang Li, Min Dong, Dezhen Li. A new multiscale texture surface defect detection method based on convolutional neural network. In Marek Z. Reformat, Du Zhang, Nikolaos G. Bourbakis, editors, 34th IEEE International Conference on Tools with Artificial Intelligence, ICTAI 2022, Macao, China, October 31 - November 2, 2022. pages 1296-1300, IEEE, 2022. [doi]

Abstract

Abstract is missing.