Yang Li, Sho Endo, Nicolas Debande, Naofumi Homma, Takafumi Aoki, Thanh-Ha Le, Jean-Luc Danger, Kazuo Ohta, Kazuo Sakiyama. Exploring the Relations between Fault Sensitivity and Power Consumption. In Emmanuel Prouff, editor, Constructive Side-Channel Analysis and Secure Design - 4th International Workshop, COSADE 2013, Paris, France, March 6-8, 2013, Revised Selected Papers. Volume 7864 of Lecture Notes in Computer Science, pages 137-153, Springer, 2013. [doi]
@inproceedings{LiEDHALDOS13,
title = {Exploring the Relations between Fault Sensitivity and Power Consumption},
author = {Yang Li and Sho Endo and Nicolas Debande and Naofumi Homma and Takafumi Aoki and Thanh-Ha Le and Jean-Luc Danger and Kazuo Ohta and Kazuo Sakiyama},
year = {2013},
doi = {10.1007/978-3-642-40026-1_9},
url = {http://dx.doi.org/10.1007/978-3-642-40026-1_9},
researchr = {https://researchr.org/publication/LiEDHALDOS13},
cites = {0},
citedby = {0},
pages = {137-153},
booktitle = {Constructive Side-Channel Analysis and Secure Design - 4th International Workshop, COSADE 2013, Paris, France, March 6-8, 2013, Revised Selected Papers},
editor = {Emmanuel Prouff},
volume = {7864},
series = {Lecture Notes in Computer Science},
publisher = {Springer},
isbn = {978-3-642-40025-4},
}