Yang Li, Sho Endo, Nicolas Debande, Naofumi Homma, Takafumi Aoki, Thanh-Ha Le, Jean-Luc Danger, Kazuo Ohta, Kazuo Sakiyama. Exploring the Relations between Fault Sensitivity and Power Consumption. In Emmanuel Prouff, editor, Constructive Side-Channel Analysis and Secure Design - 4th International Workshop, COSADE 2013, Paris, France, March 6-8, 2013, Revised Selected Papers. Volume 7864 of Lecture Notes in Computer Science, pages 137-153, Springer, 2013. [doi]
@inproceedings{LiEDHALDOS13, title = {Exploring the Relations between Fault Sensitivity and Power Consumption}, author = {Yang Li and Sho Endo and Nicolas Debande and Naofumi Homma and Takafumi Aoki and Thanh-Ha Le and Jean-Luc Danger and Kazuo Ohta and Kazuo Sakiyama}, year = {2013}, doi = {10.1007/978-3-642-40026-1_9}, url = {http://dx.doi.org/10.1007/978-3-642-40026-1_9}, researchr = {https://researchr.org/publication/LiEDHALDOS13}, cites = {0}, citedby = {0}, pages = {137-153}, booktitle = {Constructive Side-Channel Analysis and Secure Design - 4th International Workshop, COSADE 2013, Paris, France, March 6-8, 2013, Revised Selected Papers}, editor = {Emmanuel Prouff}, volume = {7864}, series = {Lecture Notes in Computer Science}, publisher = {Springer}, isbn = {978-3-642-40025-4}, }