Yang Li, Sho Endo, Nicolas Debande, Naofumi Homma, Takafumi Aoki, Thanh-Ha Le, Jean-Luc Danger, Kazuo Ohta, Kazuo Sakiyama. Exploring the Relations between Fault Sensitivity and Power Consumption. In Emmanuel Prouff, editor, Constructive Side-Channel Analysis and Secure Design - 4th International Workshop, COSADE 2013, Paris, France, March 6-8, 2013, Revised Selected Papers. Volume 7864 of Lecture Notes in Computer Science, pages 137-153, Springer, 2013. [doi]
Abstract is missing.