Bin Li 0041, Xiaofei Feng, Huafeng Su, Peijun Zhong, Wensong Li, Sheng Su, Xianzhong Duan. A Noninvasive Data and Physics-Driven Approach to Identify Wiring Fault User in LVDS. IEEE T. Instrumentation and Measurement, 74:1-12, 2025. [doi]
Abstract is missing.