Improve the Robustness of Diffusive Memristor based True Random Number Generator via Voltage-to-Time Transformation - researchr publication authors

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Haoyang Li, Yuyang Fu, Tianqing Wan, Yifan Lu, Ling Yang, Yi Li. Improve the Robustness of Diffusive Memristor based True Random Number Generator via Voltage-to-Time Transformation. In 2022 IEEE International Conference on Integrated Circuits, Technologies and Applications, ICTA 2022, Xi'an, China, October 28-30, 2022. pages 58-59, IEEE, 2022. [doi]

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