Haoyang Li, Yuyang Fu, Tianqing Wan, Yifan Lu, Ling Yang, Yi Li. Improve the Robustness of Diffusive Memristor based True Random Number Generator via Voltage-to-Time Transformation. In 2022 IEEE International Conference on Integrated Circuits, Technologies and Applications, ICTA 2022, Xi'an, China, October 28-30, 2022. pages 58-59, IEEE, 2022. [doi]
@inproceedings{LiFWLYL22,
title = {Improve the Robustness of Diffusive Memristor based True Random Number Generator via Voltage-to-Time Transformation},
author = {Haoyang Li and Yuyang Fu and Tianqing Wan and Yifan Lu and Ling Yang and Yi Li},
year = {2022},
doi = {10.1109/ICTA56932.2022.9963063},
url = {https://doi.org/10.1109/ICTA56932.2022.9963063},
researchr = {https://researchr.org/publication/LiFWLYL22},
cites = {0},
citedby = {0},
pages = {58-59},
booktitle = {2022 IEEE International Conference on Integrated Circuits, Technologies and Applications, ICTA 2022, Xi'an, China, October 28-30, 2022},
publisher = {IEEE},
isbn = {978-1-6654-9269-0},
}