LiPing Li, Honghao Gao. Test suite reduction for mutation testing based on formal concept analysis. In 16th IEEE/ACIS International Conference on Software Engineering, Artificial Intelligence, Networking and Parallel/Distributed Computing, SNPD 2015, Takamatsu, Japan, June 1-3, 2015. pages 443-447, IEEE, 2015. [doi]
Abstract is missing.