Sulin Li, Jianping Gong, John A. McNeill. VCO-Based ADC With Digital Background Calibration in 65nm CMOS. In 16th IEEE International New Circuits and Systems Conference, NEWCAS 2018, Montréal, QC, Canada, June 24-27, 2018. pages 195-199, IEEE, 2018. [doi]
@inproceedings{LiGM18-2,
title = {VCO-Based ADC With Digital Background Calibration in 65nm CMOS},
author = {Sulin Li and Jianping Gong and John A. McNeill},
year = {2018},
doi = {10.1109/NEWCAS.2018.8585486},
url = {https://doi.org/10.1109/NEWCAS.2018.8585486},
researchr = {https://researchr.org/publication/LiGM18-2},
cites = {0},
citedby = {0},
pages = {195-199},
booktitle = {16th IEEE International New Circuits and Systems Conference, NEWCAS 2018, Montréal, QC, Canada, June 24-27, 2018},
publisher = {IEEE},
isbn = {978-1-5386-4859-9},
}