Jing Li, Swaroop Ghosh, Kaushik Roy. A generic and reconfigurable test paradigm using Low-cost integrated Poly-Si TFTs. In Jill Sibert, Janusz Rajski, editors, 2007 IEEE International Test Conference, ITC 2007, Santa Clara, California, USA, October 21-26, 2007. pages 1-10, IEEE, 2007. [doi]
Abstract is missing.