Quanquan Li, Yingke Gao, Tiejun Zhang, Chaohuan Hou. A test approach of combining partial scan with functional testing for high performance processors. In 2011 IEEE 9th International Conference on ASIC, ASICON 2011, Xiamen, China, October 25-28, 2011. pages 381-384, IEEE, 2011. [doi]
@inproceedings{LiGZH11,
title = {A test approach of combining partial scan with functional testing for high performance processors},
author = {Quanquan Li and Yingke Gao and Tiejun Zhang and Chaohuan Hou},
year = {2011},
doi = {10.1109/ASICON.2011.6157201},
url = {http://dx.doi.org/10.1109/ASICON.2011.6157201},
researchr = {https://researchr.org/publication/LiGZH11},
cites = {0},
citedby = {0},
pages = {381-384},
booktitle = {2011 IEEE 9th International Conference on ASIC, ASICON 2011, Xiamen, China, October 25-28, 2011},
publisher = {IEEE},
isbn = {978-1-61284-192-2},
}