Jin-Fu Li, Yu-Jane Huang. An error detection and correction scheme for RAMs with partial-write function. In 13th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2005), 3-5 August 2005, Taipei, Taiwan. pages 115-120, IEEE Computer Society, 2005. [doi]
@inproceedings{LiH05-3, title = {An error detection and correction scheme for RAMs with partial-write function}, author = {Jin-Fu Li and Yu-Jane Huang}, year = {2005}, doi = {10.1109/MTDT.2005.16}, url = {http://doi.ieeecomputersociety.org/10.1109/MTDT.2005.16}, researchr = {https://researchr.org/publication/LiH05-3}, cites = {0}, citedby = {0}, pages = {115-120}, booktitle = {13th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2005), 3-5 August 2005, Taipei, Taiwan}, publisher = {IEEE Computer Society}, isbn = {0-7695-2313-7}, }