Bo-Yi Li, Jiun-Lang Huang. A Multi-Fault Dynamic Compaction Technique for Test Pattern Count Reduction. In International SoC Design Conference, ISOCC 2018, Daegu, South Korea, November 12-15, 2018. pages 9-10, IEEE, 2018. [doi]
@inproceedings{LiH18-34,
title = {A Multi-Fault Dynamic Compaction Technique for Test Pattern Count Reduction},
author = {Bo-Yi Li and Jiun-Lang Huang},
year = {2018},
doi = {10.1109/ISOCC.2018.8649901},
url = {https://doi.org/10.1109/ISOCC.2018.8649901},
researchr = {https://researchr.org/publication/LiH18-34},
cites = {0},
citedby = {0},
pages = {9-10},
booktitle = {International SoC Design Conference, ISOCC 2018, Daegu, South Korea, November 12-15, 2018},
publisher = {IEEE},
isbn = {978-1-5386-7960-9},
}