A Multi-Fault Dynamic Compaction Technique for Test Pattern Count Reduction

Bo-Yi Li, Jiun-Lang Huang. A Multi-Fault Dynamic Compaction Technique for Test Pattern Count Reduction. In International SoC Design Conference, ISOCC 2018, Daegu, South Korea, November 12-15, 2018. pages 9-10, IEEE, 2018. [doi]

Abstract

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