A Hierarchical Test Methodology for Systems on Chip

Jin-Fu Li, Hsin-Jung Huang, Jeng-Bin Chen, Chih-Pin Su, Cheng-Wen Wu, Chuang Cheng, Shao-I Chen, Chi-Yi Hwang, Hsiao-Ping Lin. A Hierarchical Test Methodology for Systems on Chip. IEEE Micro, 22(5):69-81, 2002. [doi]

Abstract

Abstract is missing.