AF-Test: Adaptive-Frequency Scan Test Methodology for Small-Delay Defects - researchr publication authors

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Tsung-Yeh Li, Shi-Yu Huang, Hsuan-Jung Hsu, Chao-Wen Tzeng, Chih-Tsun Huang, Jing-Jia Liou, Hsi-Pin Ma, Po-Chiun Huang, Jenn-Chyou Bor, Cheng-Wen Wu, Ching-Cheng Tien, Mike Wang. AF-Test: Adaptive-Frequency Scan Test Methodology for Small-Delay Defects. In 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2010, Kyoto, Japan, October 6-8, 2010. pages 340-348, IEEE Computer Society, 2010. [doi]

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