Tsu-Lin Li, Masaki Hashizume, Shyue-Kung Lu. An Efficient Test and Repair Flow for Yield Enhancement of One-Time-Programming NROM-Based ROMs. IEICE Transactions, 96-D(9):2026-2030, 2013. [doi]
@article{LiHL13,
title = {An Efficient Test and Repair Flow for Yield Enhancement of One-Time-Programming NROM-Based ROMs},
author = {Tsu-Lin Li and Masaki Hashizume and Shyue-Kung Lu},
year = {2013},
url = {http://search.ieice.org/bin/summary.php?id=e96-d_9_2026},
researchr = {https://researchr.org/publication/LiHL13},
cites = {0},
citedby = {0},
journal = {IEICE Transactions},
volume = {96-D},
number = {9},
pages = {2026-2030},
}