An Efficient Test and Repair Flow for Yield Enhancement of One-Time-Programming NROM-Based ROMs

Tsu-Lin Li, Masaki Hashizume, Shyue-Kung Lu. An Efficient Test and Repair Flow for Yield Enhancement of One-Time-Programming NROM-Based ROMs. IEICE Transactions, 96-D(9):2026-2030, 2013. [doi]

Abstract

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