Modeling of ESR in metallized film capacitors and its implication on pulse handling capability

Hua Li, Xiang Huang, Zhiwei Li, Haoyuan Li, Wenjuan Wang, Bowen Wang, Qin Zhang, Fuchang Lin. Modeling of ESR in metallized film capacitors and its implication on pulse handling capability. Microelectronics Reliability, 55(7):1046-1053, 2015. [doi]

Authors

Hua Li

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Xiang Huang

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Zhiwei Li

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Haoyuan Li

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Wenjuan Wang

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Bowen Wang

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Qin Zhang

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Fuchang Lin

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