Hua Li, Xiang Huang, Zhiwei Li, Haoyuan Li, Wenjuan Wang, Bowen Wang, Qin Zhang, Fuchang Lin. Modeling of ESR in metallized film capacitors and its implication on pulse handling capability. Microelectronics Reliability, 55(7):1046-1053, 2015. [doi]
@article{LiHLLWWZL15,
title = {Modeling of ESR in metallized film capacitors and its implication on pulse handling capability},
author = {Hua Li and Xiang Huang and Zhiwei Li and Haoyuan Li and Wenjuan Wang and Bowen Wang and Qin Zhang and Fuchang Lin},
year = {2015},
doi = {10.1016/j.microrel.2015.04.007},
url = {http://dx.doi.org/10.1016/j.microrel.2015.04.007},
researchr = {https://researchr.org/publication/LiHLLWWZL15},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {55},
number = {7},
pages = {1046-1053},
}