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Xunyu Li, Weiquan Hao, Zijin Pan, Yunru Miao, Zijian Yue, Albert Z. Wang. Practical Considerations on ESD Testing. In 42nd IEEE VLSI Test Symposium, VTS 2024, Tempe, AZ, USA, April 22-24, 2024. pages 1-3, IEEE, 2024. [doi]
Abstract is missing.