Yun-Jui Li, Ching-Yi Huang, Chia-Cheng Wu, Yung-Chih Chen, Chun-Yao Wang, Suman Datta, Vijaykrishnan Narayanan. Dynamic Diagnosis for Defective Reconfigurable Single-Electron Transistor Arrays. IEEE Trans. VLSI Syst., 25(4):1477-1489, 2017. [doi]
@article{LiHWCWDN17,
title = {Dynamic Diagnosis for Defective Reconfigurable Single-Electron Transistor Arrays},
author = {Yun-Jui Li and Ching-Yi Huang and Chia-Cheng Wu and Yung-Chih Chen and Chun-Yao Wang and Suman Datta and Vijaykrishnan Narayanan},
year = {2017},
doi = {10.1109/TVLSI.2016.2639533},
url = {http://doi.ieeecomputersociety.org/10.1109/TVLSI.2016.2639533},
researchr = {https://researchr.org/publication/LiHWCWDN17},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {25},
number = {4},
pages = {1477-1489},
}