Ren Li, Jared S. Johansen, Hamad Ahmed, Thomas V. Ilyevsky, Ronnie B. Wilbur, Hari M. Bharadwaj, Jeffrey Mark Siskind. The Perils and Pitfalls of Block Design for EEG Classification Experiments. IEEE Trans. Pattern Anal. Mach. Intell., 43(1):316-333, 2021. [doi]
Abstract is missing.