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Variation-aware, reliability-emphasized design and optimization of RRAM using SPICE model

H. Li, Z. Jiang, P. Huang, Y. Wu, H. Y. Chen, B. Gao, X. Y. Liu, J. F. Kang, H.-S. P. Wong. Variation-aware, reliability-emphasized design and optimization of RRAM using SPICE model. In Wolfgang Nebel, David Atienza, editors, Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, DATE 2015, Grenoble, France, March 9-13, 2015. pages 1425-1430, ACM, 2015. [doi]

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H. Li

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Z. Jiang

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P. Huang

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Y. Wu

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H. Y. Chen

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B. Gao

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X. Y. Liu

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J. F. Kang

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H.-S. P. Wong

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