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Tianjian Li, Li Jiang, Xiaoyao Liang, Qiang Xu, Krishnendu Chakrabarty. Defect tolerance for CNFET-based SRAMs. In 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016. pages 1-9, IEEE, 2016. [doi]