Tianjian Li, Li Jiang, Xiaoyao Liang, Qiang Xu, Krishnendu Chakrabarty. Defect tolerance for CNFET-based SRAMs. In 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016. pages 1-9, IEEE, 2016. [doi]
@inproceedings{LiJLXC16,
title = {Defect tolerance for CNFET-based SRAMs},
author = {Tianjian Li and Li Jiang and Xiaoyao Liang and Qiang Xu and Krishnendu Chakrabarty},
year = {2016},
doi = {10.1109/TEST.2016.7805833},
url = {http://dx.doi.org/10.1109/TEST.2016.7805833},
researchr = {https://researchr.org/publication/LiJLXC16},
cites = {0},
citedby = {0},
pages = {1-9},
booktitle = {2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016},
publisher = {IEEE},
isbn = {978-1-4673-8773-6},
}