The influence of electric-field bending on the nonlinearity of capacitive sensors

Xiujun Li, Gerben de Jong, Gerard C. M. Meijer. The influence of electric-field bending on the nonlinearity of capacitive sensors. IEEE T. Instrumentation and Measurement, 49(2):256-259, 2000. [doi]

Authors

Xiujun Li

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Gerben de Jong

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Gerard C. M. Meijer

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