The influence of electric-field bending on the nonlinearity of capacitive sensors

Xiujun Li, Gerben de Jong, Gerard C. M. Meijer. The influence of electric-field bending on the nonlinearity of capacitive sensors. IEEE T. Instrumentation and Measurement, 49(2):256-259, 2000. [doi]

@article{LiJM00,
  title = {The influence of electric-field bending on the nonlinearity of capacitive sensors},
  author = {Xiujun Li and Gerben de Jong and Gerard C. M. Meijer},
  year = {2000},
  doi = {10.1109/19.843059},
  url = {http://dx.doi.org/10.1109/19.843059},
  researchr = {https://researchr.org/publication/LiJM00},
  cites = {0},
  citedby = {0},
  journal = {IEEE T. Instrumentation and Measurement},
  volume = {49},
  number = {2},
  pages = {256-259},
}