Xiujun Li, Gerben de Jong, Gerard C. M. Meijer. The influence of electric-field bending on the nonlinearity of capacitive sensors. IEEE T. Instrumentation and Measurement, 49(2):256-259, 2000. [doi]
@article{LiJM00, title = {The influence of electric-field bending on the nonlinearity of capacitive sensors}, author = {Xiujun Li and Gerben de Jong and Gerard C. M. Meijer}, year = {2000}, doi = {10.1109/19.843059}, url = {http://dx.doi.org/10.1109/19.843059}, researchr = {https://researchr.org/publication/LiJM00}, cites = {0}, citedby = {0}, journal = {IEEE T. Instrumentation and Measurement}, volume = {49}, number = {2}, pages = {256-259}, }