Performance Enhancement in High-Speed Contact-Mode Atomic Force Microscopy

Zhichong Li, Edward Lee, Foued Ben Amara. Performance Enhancement in High-Speed Contact-Mode Atomic Force Microscopy. IEEE Trans. Contr. Sys. Techn., 17(5):1193-1201, 2009. [doi]

Authors

Zhichong Li

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Edward Lee

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Foued Ben Amara

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