Performance Enhancement in High-Speed Contact-Mode Atomic Force Microscopy

Zhichong Li, Edward Lee, Foued Ben Amara. Performance Enhancement in High-Speed Contact-Mode Atomic Force Microscopy. IEEE Trans. Contr. Sys. Techn., 17(5):1193-1201, 2009. [doi]

@article{LiLA09,
  title = {Performance Enhancement in High-Speed Contact-Mode Atomic Force Microscopy},
  author = {Zhichong Li and Edward Lee and Foued Ben Amara},
  year = {2009},
  doi = {10.1109/TCST.2008.2004810},
  url = {http://dx.doi.org/10.1109/TCST.2008.2004810},
  researchr = {https://researchr.org/publication/LiLA09},
  cites = {0},
  citedby = {0},
  journal = {IEEE Trans. Contr. Sys. Techn.},
  volume = {17},
  number = {5},
  pages = {1193-1201},
}