China Test Conference (CTC) - Extending the Global Test Forum to China

Huawei Li, Xiaowei Li 0001, Yinhe Han. China Test Conference (CTC) - Extending the Global Test Forum to China. In IEEE International Test Conference, ITC 2019, Washington, DC, USA, November 9-15, 2019. pages 1-4, IEEE, 2019. [doi]

Authors

Huawei Li

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Xiaowei Li 0001

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Yinhe Han

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