Nan Li, Yu Lei, Haider Riaz Khan, Jingshu Liu, Yun Guo. Applying combinatorial test data generation to big data applications. In David Lo, Sven Apel, Sarfraz Khurshid, editors, Proceedings of the 31st IEEE/ACM International Conference on Automated Software Engineering. pages 637-647, ACM, 2016. [doi]
@inproceedings{LiLKLG16,
title = {Applying combinatorial test data generation to big data applications},
author = {Nan Li and Yu Lei and Haider Riaz Khan and Jingshu Liu and Yun Guo},
year = {2016},
doi = {10.1145/2970276.2970325},
url = {http://doi.acm.org/10.1145/2970276.2970325},
researchr = {https://researchr.org/publication/LiLKLG16},
cites = {0},
citedby = {0},
pages = {637-647},
booktitle = {Proceedings of the 31st IEEE/ACM International Conference on Automated Software Engineering},
editor = {David Lo and Sven Apel and Sarfraz Khurshid},
publisher = {ACM},
isbn = {978-1-4503-3845-5},
}