Applying combinatorial test data generation to big data applications

Nan Li, Yu Lei, Haider Riaz Khan, Jingshu Liu, Yun Guo. Applying combinatorial test data generation to big data applications. In David Lo, Sven Apel, Sarfraz Khurshid, editors, Proceedings of the 31st IEEE/ACM International Conference on Automated Software Engineering. pages 637-647, ACM, 2016. [doi]

Abstract

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